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Interaction of ambient gas and meniscus surface during growth of edge-defined film-fed growth polycrystalline silicon samples.
- Source :
- Journal of Applied Physics; 9/15/1991, Vol. 70 Issue 6, p2963, 5p, 4 Graphs
- Publication Year :
- 1991
-
Abstract
- Reports on the interaction of ambient gas and meniscus surface during growth of edge-defined film-fed growth (EFG) polycrystalline silicon samples. Impact of carbon monoxide and carbon dioxide on carbon content of the nonagons; Significance of the presence of oxygen in edge-defined film-fed grown polycrystalline silicon ribbon; Depth profiles of oxygen and carbon for EFG.
- Subjects :
- SILICON
CARBON monoxide
CARBON dioxide
OXYGEN
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 70
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7654925
- Full Text :
- https://doi.org/10.1063/1.349322