Back to Search
Start Over
Transmission electron microscopy and transmission electron diffraction structural studies of heteroepitaxial InAsySb1-y molecular-beam epitaxial layers.
- Source :
- Journal of Applied Physics; 6/15/1993, Vol. 73 Issue 12, p8227, 10p, 6 Black and White Photographs, 1 Diagram, 3 Charts, 1 Graph
- Publication Year :
- 1993
-
Abstract
- Presents the results of transmission electron microscopy and transmission electron diffraction studies on heteroepitaxial InAs[suby]Sb[sub1-y] layers grown by molecular beam epitaxy (MBE). Properties of InAs[suby]Sb[sub1-y] layers grown by MBE; Composition of layer lattices; Analysis on the stability of phase-separated plates by annealing experiments.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 73
- Issue :
- 12
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7654050
- Full Text :
- https://doi.org/10.1063/1.353440