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Transmission-line-matrix modeling of grain-boundary diffusion in thin films.

Authors :
Gui, Xiang
Dew, Steven K.
Brett, Michael J.
de Cogan, Donard
Source :
Journal of Applied Physics; 12/15/1993, Vol. 74 Issue 12, p7173, 8p
Publication Year :
1993

Abstract

Presents information on a study which demonstrated the use of the transmission-line-matrix method for analyzing the grain boundary and interfacial diffusion problems in thin films. Methods; Results; Discussion.

Subjects

Subjects :
ELECTRIC lines
MATRICES (Mathematics)
KIRKENDALL effect
INTERFACES (Physical sciences)
THIN films

Details

Language :
English
ISSN :
00218979
Volume :
74
Issue :
12
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7653482
Full Text :
https://doi.org/10.1063/1.355034
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