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Transmission electron microscopy and scanning transmission electron microscope analysis of the effects of thermal processing on the structural integrity of GaInAs/GaInAsP multilayers.

Authors :
Mallard, R. E.
Long, N. J.
Thrush, E. J.
Scarrott, K.
Norman, A. G.
Booker, G. R.
Source :
Journal of Applied Physics; 5/1/1993, Vol. 73 Issue 9, p4297, 8p
Publication Year :
1993

Abstract

Presents a study that reported the structural characterization by electron microscopy of a metalorganic chemical vapor deposition grown GaInAs/GaInAsP multiple-quantum-well structure undergoing a blue shift in luminescence wavelength upon thermal processing, as part of a multistage epitaxial growth process. Experimental details; Results of the study; Details of stem mapping of blue-shifted multilayers.

Details

Language :
English
ISSN :
00218979
Volume :
73
Issue :
9
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7649100
Full Text :
https://doi.org/10.1063/1.352812