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WSi0.11 Schottky gates for GaAs metal semiconductor field-effect transistors.

Authors :
Callegari, A.
Spiers, G. D.
Magerlein, J. H.
Guthrie, H. C.
Source :
Journal of Applied Physics; 3/1/1987, Vol. 61 Issue 5, p2054, 5p
Publication Year :
1987

Abstract

Presents information on a study which described the utilization of tungsten silicon to form gates for gallium arsenide (GaAs) metal semiconductor field-effect transistors (FET). Discussion on diode fabrication and measurements; Film characteristics; Examination of the GaAs surface using x-ray photoemission spectroscopy; Analysis of the electrical properties of large Schottky diodes; Fabrication of various FET properties.

Details

Language :
English
ISSN :
00218979
Volume :
61
Issue :
5
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7648876
Full Text :
https://doi.org/10.1063/1.338004