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Interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers.
- Source :
- Journal of Applied Physics; 2/1/1991, Vol. 69 Issue 3, p1371, 6p
- Publication Year :
- 1991
-
Abstract
- Discusses the interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers. Investigation of the structure and physical properties of silicon-based multilayers; Use of neutron diffraction, small-angle x-ray scattering and transmission electron microscopy to characterize the specimens; Experimental details and result of the study.
- Subjects :
- TRANSMISSION electron microscopy
SILICON
GERMANIUM
IRON
NEUTRON diffraction
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 69
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7647303
- Full Text :
- https://doi.org/10.1063/1.347275