Interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers.

Authors :: Donovan, P.
George, B.
Bruson, A.
Dufour, C.
Marchal, G.
Mangin, Ph.
Source :: Journal of Applied Physics; 2/1/1991, Vol. 69 Issue 3, p1371, 6p
Publication Year :: 1991
Abstract: Discusses the interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers. Investigation of the structure and physical properties of silicon-based multilayers; Use of neutron diffraction, small-angle x-ray scattering and transmission electron microscopy to characterize the specimens; Experimental details and result of the study.

Subjects :: TRANSMISSION electron microscopy
SILICON
GERMANIUM
IRON
NEUTRON diffraction

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