Surface electron-diffraction patterns of β-FeSi2 films epitaxially grown on silicon.

Authors :: Mahan, John E.
Thanh, V. Le
Chevrier, J.
Berbezier, I.
Derrien, J.
Long, Robert G.
Source :: Journal of Applied Physics; 8/1/1993, Vol. 74 Issue 3, p1747, 15p, 10 Black and White Photographs, 21 Diagrams
Publication Year :: 1993
Abstract: Examines the surface electron-diffraction patterns of Β-iron-silicon films epitaxially grown on silicon. Crystal structure of the films; Propensity for formation of epitaxial variants by rotation twinning; Use of in situ transmission reflection high-energy electron diffraction from rough but epitaxial films.

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