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Lateral carrier diffusion and surface recombination in InGaAs/AlGaAs quantum-well ridge-waveguide lasers.

Authors :
Hu, S. Y.
Corzine, S. W.
Law, K.-K.
Young, D. B.
Gossard, A. C.
Coldren, L. A.
Merz, J. L.
Source :
Journal of Applied Physics; 10/15/1994, Vol. 76 Issue 8, p4479, 9p, 2 Diagrams, 8 Graphs
Publication Year :
1994

Abstract

Presents information on a study that measured the increase in threshold currents due to lateral carrier diffusion in InGaAs/AlGaAs quantum-well (QW) ridge-waveguide laser diodes. Sample preparation and characterization; Optical gain calculation for the InGaAs QW; Conclusions.

Details

Language :
English
ISSN :
00218979
Volume :
76
Issue :
8
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7637923
Full Text :
https://doi.org/10.1063/1.357279