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Defect levels in electrodeposited n-type CdTe thin films.

Authors :
So, S. M.
Hwang, W.
Meyers, P. V.
Liu, C. H.
Source :
Journal of Applied Physics; 3/15/1987, Vol. 61 Issue 6, p2234, 10p, 1 Diagram, 8 Graphs
Publication Year :
1987

Abstract

Presents a study which used admittance spectroscopy to measure electron traps near the conduction of the n-type electrodeposited cadmium tellurium thin films. Methodology; Results and discussion; Conclusion.

Subjects

Subjects :
SPECTRUM analysis
ELECTRONS
CADMIUM
TELLURIUM
THIN films

Details

Language :
English
ISSN :
00218979
Volume :
61
Issue :
6
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7633825
Full Text :
https://doi.org/10.1063/1.337985
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