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Steady-state Nyquist theorem for multi-terminal nondegenerate semiconductor devices.

Authors :
Lee, J. B.
Min, H. S.
Park, Y. J.
Source :
Journal of Applied Physics; 6/15/1994, Vol. 75 Issue 12, p8182, 13p
Publication Year :
1994

Abstract

Deals with a steady-state Nyquist theorem for multi-terminal nondegenerate semiconductor devices. Derivation of formulas for the spectral intensities of the short-circuit thermal noise currents in arbitrarily shaped multi-terminal semiconductor devices under direct current bias; Experimental details; Result of the study.

Subjects

Subjects :
SEMICONDUCTORS
SHORT circuits

Details

Language :
English
ISSN :
00218979
Volume :
75
Issue :
12
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7633588
Full Text :
https://doi.org/10.1063/1.356518