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Evidence for Pd bonding with Si intermediate oxidation states.
- Source :
- Journal of Applied Physics; 1/15/1993, Vol. 73 Issue 2, p749, 6p, 2 Charts, 7 Graphs
- Publication Year :
- 1993
-
Abstract
- Presents a study which examined the bonding of palladium atoms evaporated on a thin layer of silicon intermediate oxidation states using core level and valence band photoemission spectroscopy. Theoretical background; Methodology; Results.
- Subjects :
- ATOMIC structure
PALLADIUM
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 73
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7631028
- Full Text :
- https://doi.org/10.1063/1.353332