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Sol-gel silicate thin-film electronic properties.

Authors :
Warren, W. L.
Lenahan, P. M.
Brinker, C. J.
Ashley, C. S.
Reed, S. T.
Shaffer, G. R.
Source :
Journal of Applied Physics; 4/15/1991, Vol. 69 Issue 8, p4404, 5p
Publication Year :
1991

Abstract

Identifies several factors affecting the thin-film electronic properties of sol-gel-derived silicate thin films. Experimental procedures involved in the study; Description of the dielectric integrity exhibited by sol-gel dielectrics; Effect of water to silicon alkoxide ratio on the film's electronic and physical properties.

Details

Language :
English
ISSN :
00218979
Volume :
69
Issue :
8
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7625523
Full Text :
https://doi.org/10.1063/1.348366