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Contribution of oxygen related defects to the electronic transport in SnO 2 sol-gel films.

Authors :
Scalvi, L. V. A.
Geraldo, V.
Messias, F. R.
Li, M. S.
Santilli, C. V.
Pulcinelli, S. H.
Source :
Radiation Effects & Defects in Solids; Dec2001, Vol. 156 Issue 1-4, p145-149, 5p
Publication Year :
2001

Details

Language :
English
ISSN :
10420150
Volume :
156
Issue :
1-4
Database :
Complementary Index
Journal :
Radiation Effects & Defects in Solids
Publication Type :
Academic Journal
Accession number :
75794778
Full Text :
https://doi.org/10.1080/10420150108216886