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Three-dimensional transport imaging for the spatially resolved determination of carrier diffusion length in bulk materials.
- Source :
- Review of Scientific Instruments; Apr2012, Vol. 83 Issue 4, p043702-043702-7, 1p
- Publication Year :
- 2012
-
Abstract
- A contact-free optical technique is developed to enable a spatially resolved measurement of minority carrier diffusion length and the associated mobility-lifetime (μτ) product in bulk semiconductor materials. A scanning electron microscope is used in combination with an internal optical microscope and imaging charge-coupled device (CCD) to image the bulk luminescence from minority carrier recombination associated with one-dimensional excess carrier generation. Using a Green's function to model steady-state minority carrier diffusion in a three-dimensional half space, non-linear least squares analysis is then applied to extract values of carrier diffusion length and surface recombination velocity. The approach enables measurement of spatial variations in the μτ product with a high degree of spatial resolution. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 83
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 74668769
- Full Text :
- https://doi.org/10.1063/1.3698090