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Automated bench test for UHF RFID tags measurement in operational environment.

Authors :
Pouzin, Audrey
Vuong, Tan-Phu
Tedjini, Smaïl
Perdereau, Jacques
Source :
International Journal of Microwave & Wireless Technologies; Aug2011, Vol. 3 Issue 4, p415-422, 8p
Publication Year :
2011

Abstract

This paper synthesizes protocol measurements for Ultra High Frequency (UHF) radiofrequency identification (RFID) tags’ performance. We introduce the main parameters allowing the evaluation of an inlay tag performances. We characterize all devices implemented on the test bench. We explain the different programs and all methods used for the software automation. Finally, we studied the variation of the measured parameters as a function of power, frequency, or tag orientation, both in free space and in disturbed environment through our automated test bench [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
17590787
Volume :
3
Issue :
4
Database :
Complementary Index
Journal :
International Journal of Microwave & Wireless Technologies
Publication Type :
Academic Journal
Accession number :
74555476
Full Text :
https://doi.org/10.1017/S1759078711000511