Atomic force microscopy study of the morphological modifications induced by laser processing of Si(1-x)Gex/Si samples.

Details

Language :

English

ISSN :

10711023

Volume :

16

Issue :

3

Database :

Complementary Index

Journal :

Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures

Publication Type :

Academic Journal

Accession number :

74342914

Full Text :

https://doi.org/10.1116/1.590051