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Patterning accuracy improvement of the electron beam direct writing system EX-8D.

Authors :
Yoshikawa, R.
Hattori, K.
Wada, H.
Magoshi, S.
Sunaoshi, H.
Ando, A.
Yamaguchi, T.
Mikami, S.
Nishimura, S.
Housai, H.
Hashimoto, S.
Takigawa, T.
Source :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1995, Vol. 13 Issue 6, p2493-2497, 5p
Publication Year :
1995

Details

Language :
English
ISSN :
10711023
Volume :
13
Issue :
6
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
Publication Type :
Academic Journal
Accession number :
74341211
Full Text :
https://doi.org/10.1116/1.588380