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Electron beam fluorescence temperature measurements of N2 in a semiconductor plasma reactor.

Authors :
Shimada, M.
Cattolica, R.
Tynan, G. R.
Source :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 2004, Vol. 22 Issue 2, p371-376, 6p
Publication Year :
2004

Details

Language :
English
ISSN :
07342101
Volume :
22
Issue :
2
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
Publication Type :
Academic Journal
Accession number :
74337493
Full Text :
https://doi.org/10.1116/1.1644113