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Characterization of thin metal films processed at different temperatures.

Authors :
Siewenie, J. E.
He, L.
Source :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1999, Vol. 17 Issue 4, p1799-1804, 6p
Publication Year :
1999

Details

Language :
English
ISSN :
07342101
Volume :
17
Issue :
4
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
Publication Type :
Academic Journal
Accession number :
74335433
Full Text :
https://doi.org/10.1116/1.581893