Strain and critical thickness in GaSb(001)/AlSb.

Authors :: Gossmann, H.-J.
Schwartz, G. P.
Davidson, B. A.
Gualtieri, G. J.
Source :: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1989, Vol. 7 Issue 4, p764-766, 3p
Publication Year :: 1989

Language :: English
ISSN :: 0734211X
Volume :: 7
Issue :: 4
Database :: Complementary Index
Journal :: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena
Publication Type :: Academic Journal
Accession number :: 74325985
Full Text :: https://doi.org/10.1116/1.584641