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Kinetics of formation and properties of epitaxial CoSi2 films on Si (111).

Authors :
D'Avitaya, F. Arnaud
Delage, S.
Rosencher, E.
Derrien, J.
Source :
Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1985, Vol. 3 Issue 2, p770-773, 4p
Publication Year :
1985

Details

Language :
English
ISSN :
0734211X
Volume :
3
Issue :
2
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena
Publication Type :
Academic Journal
Accession number :
74324550
Full Text :
https://doi.org/10.1116/1.583140