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Solid-phase reaction and Schottky contact properties of Co/n-poly-Si0.84Ge0.16/n-Si (100).

Authors :
Wang, Guang-Wei
Ru, Guo-Ping
Qu, Xin-Ping
Li, Bing-Zong
Source :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 2004, Vol. 22 Issue 4, p1705-1710, 6p
Publication Year :
2004

Details

Language :
English
ISSN :
10711023
Volume :
22
Issue :
4
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
Publication Type :
Academic Journal
Accession number :
74322683
Full Text :
https://doi.org/10.1116/1.1763895