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Focused ion beam milling of diamond: Effects of H2O on yield, surface morphology and microstructure.

Authors :
Adams, D. P.
Vasile, M. J.
Mayer, T. M.
Hodges, V. C.
Source :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 2003, Vol. 21 Issue 6, p2334-2343, 10p
Publication Year :
2003

Details

Language :
English
ISSN :
10711023
Volume :
21
Issue :
6
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
Publication Type :
Academic Journal
Accession number :
74322273
Full Text :
https://doi.org/10.1116/1.1619421