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On test generation for transition faults with minimized peak power dissipation.

Authors :
Li, Wei
Reddy, Sudhakar M.
Pomeranz, Irith
Source :
DAC: Annual ACM/IEEE Design Automation Conference; Jun2004, p504-509, 6p
Publication Year :
2004

Details

Language :
English
ISSN :
0738100X
Database :
Complementary Index
Journal :
DAC: Annual ACM/IEEE Design Automation Conference
Publication Type :
Conference
Accession number :
73578025
Full Text :
https://doi.org/10.1145/996566.996706