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Industrial experience with test generation languages for processor verification.
- Source :
- DAC: Annual ACM/IEEE Design Automation Conference; Jun2004, p36-40, 5p
- Publication Year :
- 2004
Details
- Language :
- English
- ISSN :
- 0738100X
- Database :
- Complementary Index
- Journal :
- DAC: Annual ACM/IEEE Design Automation Conference
- Publication Type :
- Conference
- Accession number :
- 73577925
- Full Text :
- https://doi.org/10.1145/996566.996578