Back to Search
Start Over
Measurement of the Integrated X-Ray Intensities of Ge and Si.
- Source :
- Journal of Applied Physics; Dec1969, Vol. 40 Issue 13, p5038-5044, 7p
- Publication Year :
- 1969
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 40
- Issue :
- 13
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 73383693
- Full Text :
- https://doi.org/10.1063/1.1657351