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Measurements of Lifetime in GaAs Diodes.

Authors :
Takusagawa, M.
Funayama, T.
Nishizawa, J.
Demizu, K.
Nakano, T.
Source :
Journal of Applied Physics; Sep1967, Vol. 38 Issue 10, p4084-4086, 3p
Publication Year :
1967

Details

Language :
English
ISSN :
00218979
Volume :
38
Issue :
10
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
73381337
Full Text :
https://doi.org/10.1063/1.1709076