Back to Search Start Over

Effect of charge inhomogeneities on silicon surface mobility.

Authors :
Cheng, Y. C.
Source :
Journal of Applied Physics; May1973, Vol. 44 Issue 5, p2425-2427, 3p
Publication Year :
1973

Details

Language :
English
ISSN :
00218979
Volume :
44
Issue :
5
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
73369761
Full Text :
https://doi.org/10.1063/1.1662584