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Role of defects in determining the electrical properties of CdS thin films. II. Stacking faults.

Authors :
Kazmerski, L.L.
Berry, W.B.
Allen, C.W.
Source :
Journal of Applied Physics; Aug1972, Vol. 43 Issue 8, p3521-3527, 7p
Publication Year :
1972

Details

Language :
English
ISSN :
00218979
Volume :
43
Issue :
8
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
73368657
Full Text :
https://doi.org/10.1063/1.1661747