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Semiconducting behavior of Ag2Te thin films and the dependence of band gap on thickness.

Authors :
Das, V. Damodara
Karunakaran, D.
Source :
Journal of Applied Physics; Sep1983, Vol. 54 Issue 9, p5252-5255, 4p
Publication Year :
1983

Details

Language :
English
ISSN :
00218979
Volume :
54
Issue :
9
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
72871147
Full Text :
https://doi.org/10.1063/1.332753