High resolution imaging of the interfacial region in metal-insulator-semiconductor and Schottky diodes.

Details

Language :

English

ISSN :

00218979

Volume :

54

Issue :

5

Database :

Complementary Index

Journal :

Journal of Applied Physics

Publication Type :

Academic Journal

Accession number :

72870690

Full Text :

https://doi.org/10.1063/1.332289