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Determination of surface recombination velocity at a grain boundary using electron-beam-induced current.

Authors :
Burk, D. E.
Kanner, S.
Muyshondt, J. E.
Shaulis, D. S.
Russell, P. E.
Source :
Journal of Applied Physics; Jan1983, Vol. 54 Issue 1, p169-173, 5p
Publication Year :
1983

Details

Language :
English
ISSN :
00218979
Volume :
54
Issue :
1
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
72870379
Full Text :
https://doi.org/10.1063/1.331726