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Scattering of charge carriers in silicon surface layers.

Authors :
Cheng, Y. C.
Sullivan, E. A.
Source :
Journal of Applied Physics; Feb1973, Vol. 44 Issue 2, p923-925, 3p
Publication Year :
1973

Details

Language :
English
ISSN :
00218979
Volume :
44
Issue :
2
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
72860976
Full Text :
https://doi.org/10.1063/1.1662292