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Verification of carrier density profiles derived from spreading resistance measurements by comparing measured and calculated sheet resistance values.

Authors :
Mazur, R. G.
Ramey, S. M.
Hartford, C. L.
Hartford, E. J.
Kouno, M.
Tan, L. S.
Source :
AIP Conference Proceedings; Nov1998, Vol. 449 Issue 1, p226-230, 5p
Publication Year :
1998

Details

Language :
English
ISSN :
0094243X
Volume :
449
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
72855045
Full Text :
https://doi.org/10.1063/1.56799