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Tunneling spectroscopy of the silicon metal-oxide-semiconductor system.
- Source :
- AIP Conference Proceedings; Nov1998, Vol. 449 Issue 1, p261-265, 5p
- Publication Year :
- 1998
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 449
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 72855038
- Full Text :
- https://doi.org/10.1063/1.56806