High Resolution Electron-Energy-Loss Spectroscopy of Amorphous Germanium and Silicon Films.

Details

Language :

English

ISSN :

0094243X

Volume :

20

Issue :

1

Database :

Complementary Index

Journal :

AIP Conference Proceedings

Publication Type :

Conference

Accession number :

72819883

Full Text :

https://doi.org/10.1063/1.2945944