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X-ray total external reflectance-diffraction as a probe of the structure of the liquid-vapor interface.
- Source :
- Journal of Chemical Physics; Sep1983, Vol. 79 Issue 5, p2482-2486, 5p
- Publication Year :
- 1983
Details
- Language :
- English
- ISSN :
- 00219606
- Volume :
- 79
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- Journal of Chemical Physics
- Publication Type :
- Academic Journal
- Accession number :
- 72814239
- Full Text :
- https://doi.org/10.1063/1.446058