Raman scattering characterization of Ga1-xAlxAs/GaAs heterojunctions: Epilayer and interface.

Details

Language :

English

ISSN :

00036951

Volume :

41

Issue :

10

Database :

Complementary Index

Journal :

Applied Physics Letters

Publication Type :

Academic Journal

Accession number :

71387688

Full Text :

https://doi.org/10.1063/1.93356