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Two-Dimensional Self-Consistent Simulation of a Triangular P-Channel SOI Nano-Flash Memory Device.

Authors :
Tang, Xiaohui
Baie, Xavier
Colinge, Jean-Pierre
Gustin, Cedric
Bayot, Vincent
Source :
IEEE Transactions on Electron Devices; Aug2002, Vol. 49 Issue 8, p1420, 7p, 6 Diagrams, 3 Graphs
Publication Year :
2002

Abstract

Presents the simulation of a silicon-on-insulator nano-flash memory device. Simulation procedure; Device fabrication; Memory operation; Conclusion.

Details

Language :
English
ISSN :
00189383
Volume :
49
Issue :
8
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
7107658
Full Text :
https://doi.org/10.1109/TED.2002.801307