Quantitative analysis of an organic thin film by XPS, AFM and FT-IR.

Details

Language :

English

ISSN :

01422421

Volume :

44

Issue :

2

Database :

Complementary Index

Journal :

Surface & Interface Analysis: SIA

Publication Type :

Academic Journal

Accession number :

70360374

Full Text :

https://doi.org/10.1002/sia.3786