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Distribution of projection angles for single-axis-tilt electron microscope tomography of extended thin planar specimens.

Authors :
Levy, Henri A.
Olins, Ada L.
Olins, Donald E.
Source :
Journal of Microscopy; 1992, Vol. 165 Issue 2, p325-330, 6p
Publication Year :
1992

Details

Language :
English
ISSN :
00222720
Volume :
165
Issue :
2
Database :
Complementary Index
Journal :
Journal of Microscopy
Publication Type :
Academic Journal
Accession number :
67688726
Full Text :
https://doi.org/10.1111/j.1365-2818.1992.tb01490.x