High voltage electron microscope studies of void nucleation in nickel.

Details

Language :

English

ISSN :

00222720

Volume :

97

Issue :

1/2

Database :

Complementary Index

Journal :

Journal of Microscopy

Publication Type :

Academic Journal

Accession number :

67685368

Full Text :

https://doi.org/10.1111/j.1365-2818.1973.tb03767.x