Upper limit of two-dimensional electron density in enhancement-mode Si/SiGe heterostructure field-effect transistors.

In this paper, we present our study of the maximum electron density, nmax, accessible via low-temperature transport experiments in enhancement-mode Si/Si1-xGex heterostructure field-effect transistors. Experimentally, we find that nmax is much higher than the value obtained from self-consistent Schrödinger-Poisson simulations and that nmax can be changed only by changing the Ge concentration in the Si1-xGex barrier layer, not by varying the barrier layer thickness. The discrepancy between experiments and simulations is explained by a non-thermal-equilibrium tunneling-limited model. [ABSTRACT FROM AUTHOR]