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Improved Yield and Data Quality in Atom Probe Tomography.
- Source :
- Microscopy & Microanalysis; Jul2011 Supplement, Vol. 17 Issue S2, p714-715, 2p
- Publication Year :
- 2011
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011. [ABSTRACT FROM PUBLISHER]
- Subjects :
- ACQUISITION of data
TOMOGRAPHY
Subjects
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 17
- Issue :
- S2
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 66427039
- Full Text :
- https://doi.org/10.1017/S1431927611004442