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Influence of quality of images recorded in far infrared on pattern recognition based on neural networks and Eigenfaces algorithm.

Authors :
Jelen, Lukasz
Kobel, Joanna
Podbielska, Halina
Source :
Proceedings of SPIE; Nov2003, Issue 1, p255-259, 5p
Publication Year :
2003

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65896327
Full Text :
https://doi.org/10.1117/12.545143