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Step-and-scan and step-and-repeat: a technology comparison.

Authors :
van den Brink, Martin A.
Jasper, Hans
Slonaker, Steve D.
Wijnhoven, Peter
Klaassen, Frans
Source :
Proceedings of SPIE; Nov1996, Issue 1, p734-753, 20p
Publication Year :
1996

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65842587
Full Text :
https://doi.org/10.1117/12.240936