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Dispersion-assisted measurement of the refractive index and thickness by hybrid interferometer.

Authors :
Kim, Seokhan
Na, Jihoon
Kim, Myoung Jin
Lee, Byeong Ha
Source :
Proceedings of SPIE; Nov2008, Issue 1, p68470X-68470X-10, 10p
Publication Year :
2008

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65785041
Full Text :
https://doi.org/10.1117/12.761625