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A new designed ultra-high precision profiler.

Authors :
Higashi, Y.
Takaie, Y.
Endo, K.
Kume, T.
Enami, K.
Yamauchi, K.
Yamamura, K.
Sano, H.
Ueno, K.
Mori, Y.
Source :
Proceedings of SPIE; Nov2005 Part 2, Issue 1, p592107-592107-9, 9p
Publication Year :
2005

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65706132
Full Text :
https://doi.org/10.1117/12.617986