Back to Search
Start Over
Measurement of elastic properties of thin films by surface Brillouin scattering.
- Source :
- Proceedings of SPIE; Nov2000 Part 2, Issue 1, p252-263, 12p
- Publication Year :
- 2000
Details
- Language :
- English
- ISSN :
- 0277786X
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 65690974
- Full Text :
- https://doi.org/10.1117/12.401637