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Model-based OPC considering process window aspects: a study.

Authors :
Schulze, Steffen F.
Park, O'Seo
Zimmermann, Rainer
Chen, Ming-Jui
LaCour, Pat
Sahouria, Emile Y.
Granik, Yuri
Cobb, Nicolas B.
Source :
Proceedings of SPIE; Nov2002, Issue 1, p1097-1105, 9p
Publication Year :
2002

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65673494
Full Text :
https://doi.org/10.1117/12.474489